29th Midwest Symposium on Circuits and Systems
Testability Measures in Digital Circuits - A Critique Morien W. Roberts, Parag K. La la Dept. of E.C.E., Syracuse University ... Abstract Testability measures were developed to quantify the ease of testing a design without resorting to the expenseanbsp;...
| Title | : | 29th Midwest Symposium on Circuits and Systems |
| Author | : | Mohammed Ismail |
| Publisher | : | New York : North-Holland - 1987 |
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